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Read e-book online Advanced Production Testing of RF, SoC, and SiP Devices PDF

By Joe Kelly

That includes valuable enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its style source bargains skilled engineers a entire knowing of the complicated subject matters in RF, SiP (system-in-package), and SoC (system-on-a-chip) construction checking out which are serious to their paintings related to semiconductor units. The e-book covers key size options for semiconductor machine trying out and assists engineers in explaining those options to administration to help cut back venture fee, time, and assets. in keeping with real-world adventure and filled with time-saving equations, this in-depth quantity deals pros functional info on crucial issues that experience by no means been offered in one reference earlier than.

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Extra resources for Advanced Production Testing of RF, SoC, and SiP Devices

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Note that if the frequency axis could be extended infinitely, the harmonic distortion components would continue indefinitely, equally spaced, but decreasing in amplitude. 1 Harmonic distortion products due to a single-tone input, f1, to a DUT. 40 Advanced Production Testing of RF, SoC, and SiP Devices levels. It has been rarely tested for in traditional, pure-RF devices for wireless communications because RF frequencies are so high already and the second and third harmonics are far from the frequency band of interest.

As a rule of thumb, the sensitivity of an RF power measurement goes up 3 dB if the measurement bandwidth is cut in half. This might make it tempting to always select the smallest possible measurement bandwidth. It is important to know, however, that the smaller the measurement bandwidth, the longer the time required to execute the measurement. Therefore, because a short test time is one of the key objectives for every test engineer, the right compromise has to be found between small measurement bandwidth in order to perform accurate measurements of low-power signals and a wider measurement bandwidth to save test time.

This is a system-specific number that can be found in the data sheet of the device. If the measurement 2. Care has to be taken when high-power levels are measured. To avoid overdriving the measurement receiver, the RF signal might have to be attenuated or an attenuator might have to be switched into the measurement path of the test system. Tests and Measurements I: Fundamental RF Measurements 29 bandwidth of the test system is less than that of the signal, the result of the measurement will be a lower reading than anticipated.

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Advanced Production Testing of RF, SoC, and SiP Devices by Joe Kelly


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